Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results

Christchurch, New Zealand January 29-January 31

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http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994582

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	ASCII Text	x
	G. Huertas, D. Vazquez, A. Rueda, J.L. Huertas, "Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 18, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.

	BibTex	x
	@article{ 10.1109/DELTA.2002.994582, author = {G. Huertas and D. Vazquez and A. Rueda and J.L. Huertas}, title = {Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2002}, isbn = {0-7695-1453-7}, pages = {18}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994582}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results SN - 0-7695-1453-7 SP EP A1 - G. Huertas, A1 - D. Vazquez, A1 - A. Rueda, A1 - J.L. Huertas, PY - 2002 VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

G. Huertas, Universidad de Sevilla

D. Vazquez, Universidad de Sevilla

A. Rueda, Universidad de Sevilla

J.L. Huertas, Universidad de Sevilla

This paper presents experimental results corresponding to the use of Oscillation-based Test (OBT) when applied to a switched-capacitor integrated filter. A universal biquad is used as an example to demonstrate the feasibility of the OBT technique.

Citation:

G. Huertas, D. Vazquez, A. Rueda, J.L. Huertas, "Practical Oscillation-Based Test in Analog Integrated Filters: Experimental Results," delta, pp.18, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002

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