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Address and Data Scrambling: Causes and Impact on Memory Tests
Christchurch, New Zealand January 29-January 31
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994601The First IEEE International Workshop ...
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Ad. J. van de Goor, Ivo Schanstra, "Address and Data Scrambling: Causes and Impact on Memory Tests," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 128, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.
 
 
BibTex
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@article{ 10.1109/DELTA.2002.994601,
author = {Ad. J. van de Goor and Ivo Schanstra},
title = {Address and Data Scrambling: Causes and Impact on Memory Tests},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2002},
isbn = {0-7695-1453-7},
pages = {128},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994601},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Address and Data Scrambling: Causes and Impact on Memory Tests
SN - 0-7695-1453-7
SP
EP
A1 - Ad. J. van de Goor,
A1 - Ivo Schanstra,
PY - 2002
KW - Address-scrambling
KW - data-scrambling
KW - data backgrounds
KW - fault models
KW - memory tests
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Ad. J. van de Goor, Delft University of Technology
Ivo Schanstra, Infineon Technologies AG
The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a large impact on the effectiveness of the used tests. This paper presents an analysis of address and data scrambling for memory chips, at the layout and at the electrical level. A method is presented to determine the data backgrounds to be used for the different memory tests. It will be shown that the required data backgrounds are fault model, and hence, also test specific. Industrial results will show the influence of the used data backgrounds on the fault coverage of the tests.
Index Terms:
Address-scrambling, data-scrambling, data backgrounds, fault models, memory tests
Citation:
Ad. J. van de Goor, Ivo Schanstra, "Address and Data Scrambling: Causes and Impact on Memory Tests," delta, pp.128, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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