Dynamic MicroPhotonic WDM Equalizer

Perth, Australia January 28-January 30

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http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10013

Second IEEE International Workshop on ...

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	ASCII Text	x
	Mehrdad Raisi, Selam Ahderom, Kamal Alameh, Kamran Eshraghian, "Dynamic MicroPhotonic WDM Equalizer," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 59, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10013, author = {Mehrdad Raisi and Selam Ahderom and Kamal Alameh and Kamran Eshraghian}, title = {Dynamic MicroPhotonic WDM Equalizer}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {59}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10013}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Dynamic MicroPhotonic WDM Equalizer SN - 0-7695-2081-2 SP EP A1 - Mehrdad Raisi, A1 - Selam Ahderom, A1 - Kamal Alameh, A1 - Kamran Eshraghian, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Mehrdad Raisi, Edith Cowan University, Joondalup, WA, Australia

Selam Ahderom, Edith Cowan University, Joondalup, WA, Australia

Kamal Alameh, Edith Cowan University, Joondalup, WA, Australia

Kamran Eshraghian, Edith Cowan University, Joondalup, WA, Australia

An efficient wavelength division multiplexed (WDM) channel equalizer employing a dynamic MicroPhotonic processor is demonstrated. Using a proof-of-principle 6-channel equalizer setup, optimum phase holograms have been generated, which realise WDM equalisation with more than 25 dB dynamic range and less than 0.2 dB power ripples.

Citation:

Mehrdad Raisi, Selam Ahderom, Kamal Alameh, Kamran Eshraghian, "Dynamic MicroPhotonic WDM Equalizer," delta, pp.59, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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