Infrastructures for Education, Research and Industry in Microelectronics

Infrastructures for Education, Research and Industry in Microelectronics - A review

Perth, Australia January 28-January 30

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http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10010

Second IEEE International Workshop on ...

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	ASCII Text	x
	Bernard Courtois, "Infrastructures for Education, Research and Industry in Microelectronics - A review," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 149, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10010, author = {Bernard Courtois}, title = {Infrastructures for Education, Research and Industry in Microelectronics - A review}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {149}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10010}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Infrastructures for Education, Research and Industry in Microelectronics - A review SN - 0-7695-2081-2 SP EP A1 - Bernard Courtois, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Bernard Courtois, CMP Service

Infrastructures to provide access to custom integrated hardware manufacturing facilities are important because they allow Students and Researchers to access professional facilities at a reasonable cost, and they allow Companies to access small volume production, otherwise difficult to obtain directly from manufacturers. This paper is reviewing the major infrastructure services available today.

Citation:

Bernard Courtois, "Infrastructures for Education, Research and Industry in Microelectronics - A review," delta, pp.149, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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