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Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs
Cannes, France October 10-October 13
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2004.5919th IEEE International Symposium on ...
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X. Wang, M. Ottavi, F. Lombardi, "Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 111-119, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004.
 
 
BibTex
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@article{ 10.1109/DFT.2004.59,
author = {X. Wang and M. Ottavi and F. Lombardi},
title = {Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2004},
issn = {1550-5774},
pages = {111-119},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs
SN - 1550-5774
SP111
EP119
A1 - X. Wang,
A1 - M. Ottavi,
A1 - F. Lombardi,
PY - 2004
KW - Coupling fault
KW - memory
KW - inter-word fault
KW - testing
KW - detection
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
X. Wang, IBM Corp, Essex Junction (VT) USA
M. Ottavi, Northeastern University Boston (MA) USA
F. Lombardi, Northeastern University Boston (MA) USA
A new algorithm to detect inter-word coupling faults in word-organized SRAMs (WOMs) is proposed in this paper. This algorithm (referred to as March-NU) relies on a new fault model which extends fault detection to three additional types of coupling faults, i.e. read destructive, deceptive read destructive and incorrect read coupling faults. These faults are related to well known fault mechanisms that have been reported in the literature to occur in the read operation of SRAMs. Previous algorithms can not guarantee 100% fault detection of these coupling faults. March-NU sensitizes and detects with 100 % coverage all coupling faults as well as traditional faults. A detailed analysis of its fault detection capabilities are presented. March-NU utilizes 8 March elements and its complexity is 30N, where N is the number of words in the WOM under test.
Index Terms:
Coupling fault, memory, inter-word fault, testing, detection
Citation:
X. Wang, M. Ottavi, F. Lombardi, "Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs," dft, pp.111-119, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004
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