Paul Layzell,
"Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance,"
Evolvable Hardware, NASA/DoD Conference on, pp. 85, The First NASA/DOD Workshop on Evolvable Hardware, 1999.
BibTex
x
@article{
10.1109/EH.1999.785438, author = {Paul Layzell}, title = {Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance}, journal ={Evolvable Hardware, NASA/DoD Conference on}, volume = {0}, year = {1999}, isbn = {0-7695-0256-3}, pages = {85}, doi = {http://doi.ieeecomputersociety.org/10.1109/EH.1999.785438}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Evolvable Hardware, NASA/DoD Conference on TI - Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance SN - 0-7695-0256-3 SP EP A1 - Paul Layzell, PY - 1999 VL - 0 JA - Evolvable Hardware, NASA/DoD Conference on ER -
An investigation of the likelihood of evolved circuit populations to contain an individual robust to a fault which renders the previously best individual useless.
Citation:
Paul Layzell, "Inherent Qualities of Circuits Designed by Artificial Evolution: A Preliminary Study of Populational Fault Tolerance," eh, pp.85, The First NASA/DOD Workshop on Evolvable Hardware, 1999
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