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Testing and Diagnostics of SIMD Arrays
Budapest, HUNGARY September 01-September 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/EURMIC.1997.61722623rd EUROMICRO Conference '97 New Fro ...
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J. Sosnowski, "Testing and Diagnostics of SIMD Arrays," EUROMICRO Conference, pp. 96, 23rd EUROMICRO Conference '97 New Frontiers of Information Technology, 1997.
 
 
BibTex
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@article{ 10.1109/EURMIC.1997.617226,
author = {J. Sosnowski},
title = {Testing and Diagnostics of SIMD Arrays},
journal ={EUROMICRO Conference},
volume = {0},
year = {1997},
issn = {1089-6503},
pages = {96},
doi = {http://doi.ieeecomputersociety.org/10.1109/EURMIC.1997.617226},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - EUROMICRO Conference
TI - Testing and Diagnostics of SIMD Arrays
SN - 1089-6503
SP
EP
A1 - J. Sosnowski,
PY - 1997
VL - 0
JA - EUROMICRO Conference
ER -
 
J. Sosnowski, Warsaw University of Technology
An original approach to testing and diagnostics of SIMD systems is presented. Deterministic and pseudorandom test algorithms for typical data processing elements of SIMDs are described and the problem of their optimal software implementation in the SIMD environment is discussed (concurrent testing, error coverage, time overhead). The proposed efficient fault localization procedures (diagnostics) are combined with testing processes.
Citation:
J. Sosnowski, "Testing and Diagnostics of SIMD Arrays," euromicro, pp.96, 23rd EUROMICRO Conference '97 New Frontiers of Information Technology, 1997
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