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Defect and Fault Tolerance of Reconfigurable Molecular Computing
Napa, California April 20-April 23
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/FCCM.2004.2612th Annual IEEE Symposium on Field-P ...
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Mehdi B. Tahoori, Northeastern University, Boston, MA
Subhasish Mitra, Intel Corporation, Sacramento, CA
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of reconfigurable molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware. In this paper, we demonstrate how test and diagnosis techniques originally developed for FPGAs can be used in the context of molecular computing.
Citation:
Mehdi B. Tahoori, Subhasish Mitra, "Defect and Fault Tolerance of Reconfigurable Molecular Computing," fccm, pp.176-185, 12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'04), 2004
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