Pseudo-Exhaustive Testing of Sequential Circuits

Ann Arbor, Michigan March 04-March 06

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http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757388

Ninth Great Lakes Symposium on VLSI

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	ASCII Text	x
	Bassam Shaer, Sami A. Al-Arian, David Landis, "Pseudo-Exhaustive Testing of Sequential Circuits," Great Lakes Symposium on VLSI, pp. 109, Ninth Great Lakes Symposium on VLSI, 1999.

	BibTex	x
	@article{ 10.1109/GLSV.1999.757388, author = {Bassam Shaer and Sami A. Al-Arian and David Landis}, title = {Pseudo-Exhaustive Testing of Sequential Circuits}, journal ={Great Lakes Symposium on VLSI}, volume = {0}, year = {1999}, issn = {1066-1395}, pages = {109}, doi = {http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757388}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Great Lakes Symposium on VLSI TI - Pseudo-Exhaustive Testing of Sequential Circuits SN - 1066-1395 SP EP A1 - Bassam Shaer, A1 - Sami A. Al-Arian, A1 - David Landis, PY - 1999 VL - 0 JA - Great Lakes Symposium on VLSI ER -

Bassam Shaer, University of Minnesota

Sami A. Al-Arian, University of South Florida

David Landis, Pennsylvania State University

A new sequential circuit partitioning algorithm is introduced which enhances pseudo-exhaustive testing. Our PIFAN algorithm is based on an analysis of Primary Input cones and FANout values. Results are presented which show that PIFAN offers significant reductions in hardware overhead and test time when compared to alternative partitioning algorithms.

Citation:

Bassam Shaer, Sami A. Al-Arian, David Landis, "Pseudo-Exhaustive Testing of Sequential Circuits," glsvlsi, pp.109, Ninth Great Lakes Symposium on VLSI, 1999

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