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Multiple Paths Sensitization of Digital Oscillation Built-In Self Test
Austin, Texas October 10-October 13
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.8084221999 IEEE International Conference on ...
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Christian Dufaza, "Multiple Paths Sensitization of Digital Oscillation Built-In Self Test," Computer Design, International Conference on, pp. 166, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999.
 
 
BibTex
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@article{ 10.1109/ICCD.1999.808422,
author = {Christian Dufaza},
title = {Multiple Paths Sensitization of Digital Oscillation Built-In Self Test},
journal ={Computer Design, International Conference on},
volume = {0},
year = {1999},
issn = {1063-6404},
pages = {166},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808422},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer Design, International Conference on
TI - Multiple Paths Sensitization of Digital Oscillation Built-In Self Test
SN - 1063-6404
SP
EP
A1 - Christian Dufaza,
PY - 1999
KW - Test
KW - Built-In Self Test
KW - DOBIST
VL - 0
JA - Computer Design, International Conference on
ER -
 
Christian Dufaza, Universit? Montpellier II
Digital Oscillation Built-In Self Test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1st version of DOBIST is limited to single path sensitization, equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time
Index Terms:
Test, Built-In Self Test, DOBIST
Citation:
Christian Dufaza, "Multiple Paths Sensitization of Digital Oscillation Built-In Self Test," iccd, pp.166, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999
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