Jacob Savir, Zhen Guo,
"On the Detectability of Parametric Faults in Analog Circuits,"
Computer Design, International Conference on, pp. 273, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002.
BibTex
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@article{
10.1109/ICCD.2002.1106781, author = {Jacob Savir and Zhen Guo}, title = {On the Detectability of Parametric Faults in Analog Circuits}, journal ={Computer Design, International Conference on}, volume = {0}, year = {2002}, issn = {1063-6404}, pages = {273}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2002.1106781}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Computer Design, International Conference on TI - On the Detectability of Parametric Faults in Analog Circuits SN - 1063-6404 SP EP A1 - Jacob Savir, A1 - Zhen Guo, PY - 2002 KW - null VL - 0 JA - Computer Design, International Conference on ER -
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
Citation:
Jacob Savir, Zhen Guo, "On the Detectability of Parametric Faults in Analog Circuits," iccd, pp.273, 2002 IEEE International Conference on Computer Design (ICCD'02), 2002
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