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Dense Matching of Multiple Wide-baseline Views
Nice, France October 13-October 16
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCV.2003.1238627Ninth IEEE International Conference o ...
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Christoph Strecha, KU Leuven, Belgium
Tinne Tuytelaars, KU Leuven, Belgium
Luc Van Gool, KU Leuven / ETH Z?
This paper describes a PDE-based method for dense depth extraction from multiple wide-baseline images. Emphasis lies on the usage of only a small amount of images. The integration of these multiple wide-baseline views is guided by the relative confidence that the system has in the matching to different views. This weighting is fine-grained in that it is determined for every pixel at every iteration. Reliable information spreads fast at the expense of less reliable data, both in terms of spatial communications within a view and in terms of information exchange between the views. Changes in intensity between images can be handled in a similar fine grained fashion.
Citation:
Christoph Strecha, Tinne Tuytelaars, Luc Van Gool, "Dense Matching of Multiple Wide-baseline Views," iccv, vol. 2, pp.1194, Ninth IEEE International Conference on Computer Vision (ICCV'03) - Volume 2, 2003
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