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High Vertical Aspect Ratio Liga Microwave 3-DB Coupler
Banff, Alberta, Canada July 20-July 23
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICMENS.2003.12219612003 International Conference on MEMS ...
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Anton A. Kachayev, TRLabs and University of Saskatchewan
David M. Klymyshyn, TRLabs and University of Saskatchewan
Sven Achenbach, Institute for Microstructure Technology
Volker Saile, Institute for Microstructure Technology
This paper focuses on microwave directional couplers fabricated using synchrotron deep X-ray lithography (DXRL), an advanced micro- and nanofabrication technology allowing the design of microwave structures with improved performance by exploring the third dimension - metal height. Demonstrated are the influence of increased metal height on the structure characteristics and performance unattainable through conventional planar fabrication techniques.
Index Terms:
LIGA, deep X-ray lithography, high vertical aspect ratio, microwave directional coupler, coupled lines
Citation:
Anton A. Kachayev, David M. Klymyshyn, Sven Achenbach, Volker Saile, "High Vertical Aspect Ratio Liga Microwave 3-DB Coupler," icmens, pp.38, 2003 International Conference on MEMS, NANO and Smart Systems (ICMENS'03), 2003
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