Evaluation of Curve Length Measurements

Barcelona, Spain September 03-September 08

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http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.905411

15th International Conference on Patt ...

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	Reinhard Klette, Ben Yip, "Evaluation of Curve Length Measurements," Pattern Recognition, International Conference on, vol. 1, pp. 1610, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 1, 2000.

	BibTex	x
	@article{ 10.1109/ICPR.2000.905411, author = {Reinhard Klette and Ben Yip}, title = {Evaluation of Curve Length Measurements}, journal ={Pattern Recognition, International Conference on}, volume = {1}, year = {2000}, isbn = {0-7695-0750-6}, pages = {1610}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.905411}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pattern Recognition, International Conference on TI - Evaluation of Curve Length Measurements SN - 0-7695-0750-6 SP EP A1 - Reinhard Klette, A1 - Ben Yip, PY - 2000 VL - 1 JA - Pattern Recognition, International Conference on ER -

Reinhard Klette, Auckland University

Ben Yip, Auckland University

This paper compares two techniques for measuring the length of a digital curve. Both techniques (digital straight segment approximation, minimum length polygon) are known to be convergent estimators. Theoretical convergence results are cited. The focus is on experimental evaluation: several measures are defined, applied and discussed. Test sets are digitized for consecutive resolutions.

Citation:

Reinhard Klette, Ben Yip, "Evaluation of Curve Length Measurements," icpr, vol. 1, pp.1610, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 1, 2000

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