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Profile and Feature Extraction from Chromosomes
Barcelona, Spain September 03-September 08
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.90606915th International Conference on Patt ...
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Gunter Ritter, Universit?t Passau
Gernot Schreib, Universit?t Passau
The most accurate methods for automatic classification of chromosomes under a light microscope today extract numerical features from band-pattern profiles along their longitudinal axes. The construction of a reliable axis is a crucial step in this process. We propose a new way based on the dominant points of the contour and cubic splines. The dominant points serve as candidates for the tips of the chromosome or its chromatids. Ambiguities are dissolved by the recently proposed method of variants for object identification. A Voronoi diagram decomposes the chromosome in slices for profile extraction. The method improves the currently best classification results significantly yielding a test-set error rate of 0.6% applied to a data set of the band level 200.
Citation:
Gunter Ritter, Gernot Schreib, "Profile and Feature Extraction from Chromosomes," icpr, vol. 2, pp.2287, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 2, 2000
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