William D. Toczyski, Nikolaos P. Papanikolopoulos,
"Complementary Linear Biases in Spatial Derivative Estimation for Improving Geometry-Driven Diffusion Processes,"
Pattern Recognition, International Conference on, vol. 3, pp. 3001, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000.
BibTex
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@article{
10.1109/ICPR.2000.903474, author = {William D. Toczyski and Nikolaos P. Papanikolopoulos}, title = {Complementary Linear Biases in Spatial Derivative Estimation for Improving Geometry-Driven Diffusion Processes}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2000}, isbn = {0-7695-0750-6}, pages = {3001}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.903474}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Pattern Recognition, International Conference on TI - Complementary Linear Biases in Spatial Derivative Estimation for Improving Geometry-Driven Diffusion Processes SN - 0-7695-0750-6 SP EP A1 - William D. Toczyski, A1 - Nikolaos P. Papanikolopoulos, PY - 2000 VL - 3 JA - Pattern Recognition, International Conference on ER -
William D. Toczyski, Nikolaos P. Papanikolopoulos, "Complementary Linear Biases in Spatial Derivative Estimation for Improving Geometry-Driven Diffusion Processes," icpr, vol. 3, pp.3001, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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