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Epipolar Geometry Estimation via RANSAC Benefits from the Oriented Epipolar Constraint
Cambridge UK August 23-August 26
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.133402017th International Conference on Patt ...
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Ondrej Chum, Tom? Werner, Jir? Matas, "Epipolar Geometry Estimation via RANSAC Benefits from the Oriented Epipolar Constraint," Pattern Recognition, International Conference on, vol. 1, pp. 112-115, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 1, 2004.
 
 
BibTex
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@article{ 10.1109/ICPR.2004.1334020,
author = {Ondrej Chum and Tom? Werner and Jir? Matas},
title = {Epipolar Geometry Estimation via RANSAC Benefits from the Oriented Epipolar Constraint},
journal ={Pattern Recognition, International Conference on},
volume = {1},
year = {2004},
issn = {1051-4651},
pages = {112-115},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334020},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Pattern Recognition, International Conference on
TI - Epipolar Geometry Estimation via RANSAC Benefits from the Oriented Epipolar Constraint
SN - 1051-4651
SP112
EP115
A1 - Ondrej Chum,
A1 - Tom? Werner,
A1 - Jir? Matas,
PY - 2004
KW - null
VL - 1
JA - Pattern Recognition, International Conference on
ER -
 
Ondrej Chum, Czech Technical University in Prague
Tom? Werner, Czech Technical University in Prague
Jir? Matas, Czech Technical University in Prague
The efficiency of epipolar geometry estimation by RANSAC is improved by exploiting the oriented epipolar constraint. Performance evaluation shows that the enhancement brings up to a two-fold speed-up. The orientation test is simple to implement, is universally applicable and takes negligible fraction of time compared with epipolar geometry computation.
Citation:
Ondrej Chum, Tom? Werner, Jir? Matas, "Epipolar Geometry Estimation via RANSAC Benefits from the Oriented Epipolar Constraint," icpr, vol. 1, pp.112-115, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 1, 2004
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