Using Neural Networks for Fault Diagnosis

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http://doi.ieeecomputersociety.org/10.1109/IJCNN.2000.861460

IEEE-INNS-ENNS International Joint Co ...

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	Jia-Zhou He, Zhi-Hua Zhou, Xu-Ri Yin, Shi-Fu Chen, "Using Neural Networks for Fault Diagnosis," Neural Networks, IEEE - INNS - ENNS International Joint Conference on, vol. 5, pp. 5217, IEEE-INNS-ENNS International Joint Conference on Neural Networks (IJCNN'00)-Volume 5, 2000.

	BibTex	x
	@article{ 10.1109/IJCNN.2000.861460, author = {Jia-Zhou He and Zhi-Hua Zhou and Xu-Ri Yin and Shi-Fu Chen}, title = {Using Neural Networks for Fault Diagnosis}, journal ={Neural Networks, IEEE - INNS - ENNS International Joint Conference on}, volume = {5}, year = {2000}, issn = {1098-7576}, pages = {5217}, doi = {http://doi.ieeecomputersociety.org/10.1109/IJCNN.2000.861460}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Neural Networks, IEEE - INNS - ENNS International Joint Conference on TI - Using Neural Networks for Fault Diagnosis SN - 1098-7576 SP EP A1 - Jia-Zhou He, A1 - Zhi-Hua Zhou, A1 - Xu-Ri Yin, A1 - Shi-Fu Chen, PY - 2000 VL - 5 JA - Neural Networks, IEEE - INNS - ENNS International Joint Conference on ER -

Jia-Zhou He, Nanjing University

Zhi-Hua Zhou, Nanjing University

Xu-Ri Yin, Nanjing University

Shi-Fu Chen, Nanjing University

In this paper, a universal Fault Instance Model, which aims to solve problems existing in the present technology of fault diagnosis, such as the lack of universality, the difficulty in the use of real time system and the dilemma of stability and plasticity, is proposed. The experiment demonstrates that the FANNC used can successfully settles the problems mentioned above by its effectively incremental ability and processing new input patterns via one round learning.

Citation:

Jia-Zhou He, Zhi-Hua Zhou, Xu-Ri Yin, Shi-Fu Chen, "Using Neural Networks for Fault Diagnosis," ijcnn, vol. 5, pp.5217, IEEE-INNS-ENNS International Joint Conference on Neural Networks (IJCNN'00)-Volume 5, 2000

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