A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs

Kos Island, Greece July 07-July 09

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http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214360

9th IEEE International On-Line Testin ...

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	ASCII Text	x
	Y. Tsiatouhas, S. Matakias, A. Arapoyanni, Th. Haniotakis, "A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 12, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214360, author = {Y. Tsiatouhas and S. Matakias and A. Arapoyanni and Th. Haniotakis}, title = {A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {12}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214360}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs SN - 0-7695-1968-7 SP EP A1 - Y. Tsiatouhas, A1 - S. Matakias, A1 - A. Arapoyanni, A1 - Th. Haniotakis, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

Y. Tsiatouhas, University of Ioannina

S. Matakias, University of Athens

A. Arapoyanni, University of Athens

Th. Haniotakis, Southern Illinois University

We propose a new concurrent soft and timing error detection circuit that exploits the time redundancy approach to achieve tolerance with respect to transient and delay faults. The idea is based on current mode sense amplifier topologies to provide fast error detection times.

Citation:

Y. Tsiatouhas, S. Matakias, A. Arapoyanni, Th. Haniotakis, "A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs," iolts, pp.12, 9th IEEE International On-Line Testing Symposium, 2003

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