A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers

Kos Island, Greece July 07-July 09

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http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214365

9th IEEE International On-Line Testin ...

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	Steffen Tarnick, "A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 43, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214365, author = {Steffen Tarnick}, title = {A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {43}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214365}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

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	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers SN - 0-7695-1968-7 SP EP A1 - Steffen Tarnick, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

Steffen Tarnick, SATCON GmbH

A novel method for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t = 2^k - 1, Bose and Bose-Lin codes. The design technique for all three checker types is mainly based on averaging weights and check symbol values of the code words. The checkers have a simple and regular structure that does not depend on the set of code words that is provided by the circuit under check. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults and almost all combinational faults in a single cell under very weak assumptions. All three checker types can be tested with only 2 or 3 code words.

Citation:

Steffen Tarnick, "A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers," iolts, pp.43, 9th IEEE International On-Line Testing Symposium, 2003

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