Memory Built-In Self-Repair for Nanotechnologies

Kos Island, Greece July 07-July 09

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214373

9th IEEE International On-Line Testin ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by M. Nicolaidis Articles by N. Achouri Articles by L. Anghel

	ASCII Text	x
	M. Nicolaidis, N. Achouri, L. Anghel, "Memory Built-In Self-Repair for Nanotechnologies," IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International, pp. 94, 9th IEEE International On-Line Testing Symposium, 2003.

	BibTex	x
	@article{ 10.1109/OLT.2003.1214373, author = {M. Nicolaidis and N. Achouri and L. Anghel}, title = {Memory Built-In Self-Repair for Nanotechnologies}, journal ={IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2003}, isbn = {0-7695-1968-7}, pages = {94}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214373}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International TI - Memory Built-In Self-Repair for Nanotechnologies SN - 0-7695-1968-7 SP EP A1 - M. Nicolaidis, A1 - N. Achouri, A1 - L. Anghel, PY - 2003 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium/On-Line Testing Symposium, IEEE International ER -

M. Nicolaidis, iRoC Technologies

N. Achouri, iRoC Technologies

L. Anghel, TIMA laboratory

This paper presents memory Built-In Self-Repair approaches allowing to achieve high yield for defect densities several orders of magnitude higher than in current technologies. Such repair schemes illustrate that we could built memories in nanoelectronic technologies that are subject to very high defect densities.

Citation:

M. Nicolaidis, N. Achouri, L. Anghel, "Memory Built-In Self-Repair for Nanotechnologies," iolts, pp.94, 9th IEEE International On-Line Testing Symposium, 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.