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Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing
Taormina, Italy July 09-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937815Seventh International On-Line Testing ...
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Andrzej Krasniewski, "Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing," On-Line Testing Workshop, IEEE International, pp. 0037, Seventh International On-Line Testing Workshop, 2001.
 
 
BibTex
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@article{ 10.1109/OLT.2001.937815,
author = {Andrzej Krasniewski},
title = {Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2001},
isbn = {0-7695-1290-9},
pages = {0037},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937815},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing
SN - 0-7695-1290-9
SP
EP
A1 - Andrzej Krasniewski,
PY - 2001
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Andrzej Krasniewski, Warsaw University of Technology
Abstract: We explain differences between testing delay faults in FPGAs and testing delay faults in circuits whose combinational sections can be represented as gate networks. We formulate - in a form suitable for analysis of LUT-based FPGAs - conditions that allow one to check whether or not a given input pair is a test of specific type (non-robust, robust, etc.). The presented theoretical results are shown to simplify an analysis of the various methods for enhancing the effectiveness of detection of FPGA delay faults.
Citation:
Andrzej Krasniewski, "Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing," ioltw, pp.0037, Seventh International On-Line Testing Workshop, 2001
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