Concurrent Detection of Soft Errors Based on Current Monitoring

Taormina, Italy July 09-July 11

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http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937828

Seventh International On-Line Testing ...

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	ASCII Text	x
	Y. Tsiatouhas, Th. Haniotakis, D. Nikolos, C. Efstathiou, "Concurrent Detection of Soft Errors Based on Current Monitoring," On-Line Testing Workshop, IEEE International, pp. 0106, Seventh International On-Line Testing Workshop, 2001.

	BibTex	x
	@article{ 10.1109/OLT.2001.937828, author = {Y. Tsiatouhas and Th. Haniotakis and D. Nikolos and C. Efstathiou}, title = {Concurrent Detection of Soft Errors Based on Current Monitoring}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2001}, isbn = {0-7695-1290-9}, pages = {0106}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937828}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Concurrent Detection of Soft Errors Based on Current Monitoring SN - 0-7695-1290-9 SP EP A1 - Y. Tsiatouhas, A1 - Th. Haniotakis, A1 - D. Nikolos, A1 - C. Efstathiou, PY - 2001 VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Y. Tsiatouhas, Integrated Systems Development S.A.

Th. Haniotakis, Southern Illinois University

D. Nikolos, University of Patras

C. Efstathiou, TEI of Athens

Abstract: Transient faults in future ICs turns to be a major consideration as the silicon process scales down. In this paper we propose a new soft error detecting technique with low area overhead, high detection speed and negligible performance penalty on the functional circuit under check. Among the already known techniques for soft error detection in logic circuits the proposed technique is the only one that is based on current monitoring.

Citation:

Y. Tsiatouhas, Th. Haniotakis, D. Nikolos, C. Efstathiou, "Concurrent Detection of Soft Errors Based on Current Monitoring," ioltw, pp.0106, Seventh International On-Line Testing Workshop, 2001

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