A New Laser System for X-Rays Flashes Sensitivity Evaluation

Taormina, Italy July 09-July 11

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http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937829

Seventh International On-Line Testing ...

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	ASCII Text	x
	D. Lewis, H. Lapuyade, Y. Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat, "A New Laser System for X-Rays Flashes Sensitivity Evaluation," On-Line Testing Workshop, IEEE International, pp. 0111, Seventh International On-Line Testing Workshop, 2001.

	BibTex	x
	@article{ 10.1109/OLT.2001.937829, author = {D. Lewis and H. Lapuyade and Y. Deval and Y. Maidon and F. Darracq and R. Briand and P. Fouillat}, title = {A New Laser System for X-Rays Flashes Sensitivity Evaluation}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2001}, isbn = {0-7695-1290-9}, pages = {0111}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937829}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - A New Laser System for X-Rays Flashes Sensitivity Evaluation SN - 0-7695-1290-9 SP EP A1 - D. Lewis, A1 - H. Lapuyade, A1 - Y. Deval, A1 - Y. Maidon, A1 - F. Darracq, A1 - R. Briand, A1 - P. Fouillat, PY - 2001 VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

D. Lewis, Universit? Bordeaux 1

H. Lapuyade, Universit? Bordeaux 1

Y. Deval, Universit? Bordeaux 1

Y. Maidon, Universit? Bordeaux 1

F. Darracq, Universit? Bordeaux 1

R. Briand, Universit? Bordeaux 1

P. Fouillat, Universit? Bordeaux 1

Abstract: This paper describes a new methodology using an optical laser bench for ICs X-rays-flashes sensitivity evaluation. Application to the study of one hardening technique of a BandGap Reference circuit is presented.

Citation:

D. Lewis, H. Lapuyade, Y. Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat, "A New Laser System for X-Rays Flashes Sensitivity Evaluation," ioltw, pp.0111, Seventh International On-Line Testing Workshop, 2001

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