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CMOS Differential and Absolute Thermal Sensors
Taormina, Italy July 09-July 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937832Seventh International On-Line Testing ...
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Ashish Syal, Victor Lee, André Ivanov, Josep Altet, "CMOS Differential and Absolute Thermal Sensors," On-Line Testing Workshop, IEEE International, pp. 0127, Seventh International On-Line Testing Workshop, 2001.
 
 
BibTex
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@article{ 10.1109/OLT.2001.937832,
author = {Ashish Syal and Victor Lee and André Ivanov and Josep Altet},
title = {CMOS Differential and Absolute Thermal Sensors},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2001},
isbn = {0-7695-1290-9},
pages = {0127},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2001.937832},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - CMOS Differential and Absolute Thermal Sensors
SN - 0-7695-1290-9
SP
EP
A1 - Ashish Syal,
A1 - Victor Lee,
A1 - André Ivanov,
A1 - Josep Altet,
PY - 2001
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
Ashish Syal, University of British Columbia
Victor Lee, University of British Columbia
André Ivanov, University of British Columbia
Josep Altet, University of British Columbia
Abstract: This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 ?m CMOS technology.
Citation:
Ashish Syal, Victor Lee, André Ivanov, Josep Altet, "CMOS Differential and Absolute Thermal Sensors," ioltw, pp.0127, Seventh International On-Line Testing Workshop, 2001
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