Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study

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http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030192

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	R. Leveugle, K. Hadjiat, "Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study," On-Line Testing Workshop, IEEE International, pp. 107, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030192, author = {R. Leveugle and K. Hadjiat}, title = {Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {107}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030192}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

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	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study SN - 0-7695-1641-6 SP EP A1 - R. Leveugle, A1 - K. Hadjiat, PY - 2002 KW - VLSI design KW - VHDL KW - fault injection KW - dependability analysis VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

R. Leveugle, TIMA Laboratory

K. Hadjiat, TIMA Laboratory

The probability of transient faults increases with the evolution of technologies. There is a corresponding increased demand for an early analysis of erroneous behaviors. This paper reports on results obtained with SEU-like fault injections in VHDL descriptions of digital circuits. Several circuit description levels are considered, as well as several fault modeling levels. These results show that an analysis performed at a very early stage in the design process can actually give a helpful insight into the response of a circuit when a fault occurs.

Index Terms:

VLSI design, VHDL, fault injection, dependability analysis

Citation:

R. Leveugle, K. Hadjiat, "Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study," ioltw, pp.107, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

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