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On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures
Isle of Bendor, France July 08-July 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030204Proceedings of The Eighth IEEE Intern ...
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C. Galke, M. Pflanz, H. T. Vierhaus, "On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures," On-Line Testing Workshop, IEEE International, pp. 178, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030204,
author = {C. Galke and M. Pflanz and H. T. Vierhaus},
title = {On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {178},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030204},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures
SN - 0-7695-1641-6
SP
EP
A1 - C. Galke,
A1 - M. Pflanz,
A1 - H. T. Vierhaus,
PY - 2002
KW - null
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
C. Galke, Brandenburg University of Technology Cottbus
M. Pflanz, IBM Deutschland Entwicklung GmbH
H. T. Vierhaus, Brandenburg University of Technology Cottbus
Based on strategies for on-line error detection in data and control path structures in simple microprocessors, this approach proposes techniques for the control- and component-error detection in high-performance processors. Detected errors are classified on-line with respect to their impact on the control and data flow. A compensation of detected errors is performed by micro rollback with different rollback distances according to predefined priority classes of error handling.
Citation:
C. Galke, M. Pflanz, H. T. Vierhaus, "On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures," ioltw, pp.178, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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