Adam Kristof,
"On-Line Detection of Short Circuits in Digital Devices and Systems,"
On-Line Testing Workshop, IEEE International, pp. 183, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
BibTex
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@article{
10.1109/OLT.2002.1030207, author = {Adam Kristof}, title = {On-Line Detection of Short Circuits in Digital Devices and Systems}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {183}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030207}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - On-Line Testing Workshop, IEEE International TI - On-Line Detection of Short Circuits in Digital Devices and Systems SN - 0-7695-1641-6 SP EP A1 - Adam Kristof, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -
Adam Kristof, Silesian University of Technology in Gliwice
Presented method of on-line detection of overloads and short circuits in digital devices and systems is based on inexpensive overload detectors built into integrated circuits. A prototype 0.8 ?m CMOS ASIC successfully verifies this method.
Citation:
Adam Kristof, "On-Line Detection of Short Circuits in Digital Devices and Systems," ioltw, pp.183, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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