Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach

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http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030208

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	ASCII Text	x
	M. A. Naal, M. Rakotoar, E. Simeu, C. Aktouf, "Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach," On-Line Testing Workshop, IEEE International, pp. 184, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030208, author = {M. A. Naal and M. Rakotoar and E. Simeu and C. Aktouf}, title = {Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {184}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030208}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach SN - 0-7695-1641-6 SP EP A1 - M. A. Naal, A1 - M. Rakotoar, A1 - E. Simeu, A1 - C. Aktouf, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

M. A. Naal, TIMA Laboratory

M. Rakotoar, TIMA Laboratory

E. Simeu, TIMA Laboratory

C. Aktouf, LCIS-ESISAR

This paper proposes a suitable on-line testing technique during the synthesis of complex electronic structures. On-line testability is addressed by exploiting time redundancy in the scheduled data flow graph. On-line testability constraints are taken into account at the scheduling and allocation tasks. The technique implements non-concurrent; semi-concurrent or fully concurrent on-line tests according to the ability of the synthesized structure.

Citation:

M. A. Naal, M. Rakotoar, E. Simeu, C. Aktouf, "Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach," ioltw, pp.184, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

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