Analysis of the Equivalences and Dominances of Transient Faults at the RT Level

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http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030216

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	Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza, Giovanni Squillero, "Analysis of the Equivalences and Dominances of Transient Faults at the RT Level," On-Line Testing Workshop, IEEE International, pp. 193, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.

	BibTex	x
	@article{ 10.1109/OLT.2002.1030216, author = {Luis Berrojo and Isabel González and Luis Entrena and Celia López and Fulvio Corno and Matteo Sonza and Giovanni Squillero}, title = {Analysis of the Equivalences and Dominances of Transient Faults at the RT Level}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {193}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030216}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Analysis of the Equivalences and Dominances of Transient Faults at the RT Level SN - 0-7695-1641-6 SP EP A1 - Luis Berrojo, A1 - Isabel González, A1 - Luis Entrena, A1 - Celia López, A1 - Fulvio Corno, A1 - Matteo Sonza, A1 - Giovanni Squillero, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER -

Luis Berrojo, Alcatel Espacio

Isabel González, Alcatel Espacio

Luis Entrena, Universidad Carlos III de Madrid

Celia López, Universidad Carlos III de Madrid

Fulvio Corno, Polit?cnico di Torino

Matteo Sonza, Polit?cnico di Torino

Giovanni Squillero, Polit?cnico di Torino

This work presents a study for tackling transient faults at the RT-level and outlines the techniques devised and implemented to speed-up fault-injection campaigns, detecting the equivalences and dominancies between faults in order to collapse them. Experimental results are provided on an industrial case study, demonstrating the effectiveness of the approach.

Citation:

Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza, Giovanni Squillero, "Analysis of the Equivalences and Dominances of Transient Faults at the RT Level," ioltw, pp.193, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002

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