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Dynamic Instrumentation of Large-Scale MPI and OpenMP Applications
Nice, France April 22-April 26
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IPDPS.2003.1213161International Parallel and Distribute ...
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Christian Thiffault, Michael Voss, Steven T. Healey, Seon Wook Kim, "Dynamic Instrumentation of Large-Scale MPI and OpenMP Applications," Parallel and Distributed Processing Symposium, International, pp. 65b, International Parallel and Distributed Processing Symposium (IPDPS'03), 2003.
 
 
BibTex
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@article{ 10.1109/IPDPS.2003.1213161,
author = {Christian Thiffault and Michael Voss and Steven T. Healey and Seon Wook Kim},
title = {Dynamic Instrumentation of Large-Scale MPI and OpenMP Applications},
journal ={Parallel and Distributed Processing Symposium, International},
volume = {0},
year = {2003},
issn = {1530-2075},
pages = {65b},
doi = {http://doi.ieeecomputersociety.org/10.1109/IPDPS.2003.1213161},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Parallel and Distributed Processing Symposium, International
TI - Dynamic Instrumentation of Large-Scale MPI and OpenMP Applications
SN - 1530-2075
SP
EP
A1 - Christian Thiffault,
A1 - Michael Voss,
A1 - Steven T. Healey,
A1 - Seon Wook Kim,
PY - 2003
KW - dynamic instrumentation
KW - performance analysis
KW - MPI
KW - OpenMP
VL - 0
JA - Parallel and Distributed Processing Symposium, International
ER -
 
Christian Thiffault, University of Toronto
Michael Voss, University of Toronto
Steven T. Healey, Intel Americas, Inc.
Seon Wook Kim, Korea University
In recent years, software infrastructures for the run-time instrumentation of programs have begun to emerge. This paper presents and evaluates prototypes of dynamic instrumentation and dynamic control of instrumentation for parallel mixed MPI/OpenMP applications. An overview of the technology behind these approaches is presented. Prototypes of dynamic instrumentation and dynamic control of instrumentation for use with the Vampir/GuideView (VGV) toolset are discussed. Instrumentation evaluations using the ASCI kernel benchmarks are used for proof of concept on a cluster of SMPs. The results demonstrate that a mix of dynamic instrumentation and dynamic control of instrumentation can be an effective performance analysis alternative to the traditional static instrumentation of applications.
Index Terms:
dynamic instrumentation, performance analysis, MPI, OpenMP
Citation:
Christian Thiffault, Michael Voss, Steven T. Healey, Seon Wook Kim, "Dynamic Instrumentation of Large-Scale MPI and OpenMP Applications," ipdps, pp.65b, International Parallel and Distributed Processing Symposium (IPDPS'03), 2003
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