Y. Nagata, D. Miller, M. Mukaidono,
"Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs,"
Multiple-Valued Logic, IEEE International Symposium on, pp. 38, The 28th International Symposium on Multiple-Valued Logic, 1998.
BibTex
x
@article{
10.1109/ISMVL.1998.679273, author = {Y. Nagata and D. Miller and M. Mukaidono}, title = {Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs}, journal ={Multiple-Valued Logic, IEEE International Symposium on}, volume = {0}, year = {1998}, issn = {0195-623X}, pages = {38}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISMVL.1998.679273}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Multiple-Valued Logic, IEEE International Symposium on TI - Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs SN - 0195-623X SP EP A1 - Y. Nagata, A1 - D. Miller, A1 - M. Mukaidono, PY - 1998 VL - 0 JA - Multiple-Valued Logic, IEEE International Symposium on ER -
Y. Nagata, D. Miller, M. Mukaidono, "Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs," ismvl, pp.38, The 28th International Symposium on Multiple-Valued Logic, 1998
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