M. Keim, N. Drechsler, R. Drechsler, B. Becker,
"Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm,"
Multiple-Valued Logic, IEEE International Symposium on, pp. 215, The 28th International Symposium on Multiple-Valued Logic, 1998.
BibTex
x
@article{
10.1109/ISMVL.1998.679435, author = {M. Keim and N. Drechsler and R. Drechsler and B. Becker}, title = {Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm}, journal ={Multiple-Valued Logic, IEEE International Symposium on}, volume = {0}, year = {1998}, issn = {0195-623X}, pages = {215}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISMVL.1998.679435}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Multiple-Valued Logic, IEEE International Symposium on TI - Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm SN - 0195-623X SP EP A1 - M. Keim, A1 - N. Drechsler, A1 - R. Drechsler, A1 - B. Becker, PY - 1998 VL - 0 JA - Multiple-Valued Logic, IEEE International Symposium on ER -
M. Keim, N. Drechsler, R. Drechsler, B. Becker, "Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm," ismvl, pp.215, The 28th International Symposium on Multiple-Valued Logic, 1998
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