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Function Test Environment for Embedded Driver Components
Vienna, Austria May 12-May 14
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISORC.2004.1300357Seventh IEEE International Symposium ...
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Stefan Pitzek, Technische Universität Wien
Peter Puschner, Technische Universität Wien

In this paper we present a test framework for specifying, executing, and evaluating function (black-box) tests for I/O control blocks that are part of a Matlab/Simulink based rapid-prototyping (RP) development environment for distributed control applications for the time-triggered network protocol TTP/C. The framework uses the RP environment to create embedded test applications which are then executed in a physical test network. In doing so the test application itself acts as a test driver for the required I/O operations. Results from this application are then compared to reference results that are created by the framework from the simulation and from the test specification. Tests are specified independently of the programming language using a format that was designed for ease-of-use and extensive re-use of components in mind.

Concluding we present an implementation of this framework in a resource constrained real-world corporate environment, discussing problems, design decisions, and experiences gained during its development and use.

Citation:
Stefan Pitzek, Peter Puschner, "Function Test Environment for Embedded Driver Components," isorc, pp.237-244, Seventh IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC'04), 2004
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