The basic concept of embedding test functions onto the very IC design is a simple one. However, the complexity offered by the emerging system-on-chip and the very deep micron technologies has created difficult challenges and quality risks. A new wave of embedded, quality insurance functions, are needed to address this complexity level. This talk will discuss such design for quality trends and solutions and will analyze their impact not only on go/no-go test, but also on a set of expanded quality insurance functions to support debug, measurement, diagnosis and repair.