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I/O Cell Placement and Electrical Checking Methodology for ASICs with Peripheral I/Os
San Jose, California March 26-March 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.915208International Symposium on Quality El ...
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Gulsun Yasar, IBM Microelectronics Division
Charles Chiu, IBM Microelectronics Division
Robert A. Proctor, IBM Microelectronics Division
James P. Libous, IBM Microelectronics Division
Optimized I/O cell placement techniques take into account electromigration (EM), IR drop, and dI/dt noise issues in the power distribution network. This paper describes fast and easy electrical checking algorithms to be used early in the design process to verify if the I/O placements meet placement guidelines, and explains the details of the I/O cell placement-related rules used by the checking tool. Use of these techniques and methods can ensure high quality ASICs.
Citation:
Gulsun Yasar, Charles Chiu, Robert A. Proctor, James P. Libous, "I/O Cell Placement and Electrical Checking Methodology for ASICs with Peripheral I/Os," isqed, pp.71, International Symposium on Quality Electronic Design (ISQED '01), 2001
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