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New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation
San Jose, California March 22-March 24
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.12836545th International Symposium on Qualit ...
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Daniela De Venuto, "New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation," Quality Electronic Design, International Symposium on, pp. 81-85, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004.
 
 
BibTex
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@article{ 10.1109/ISQED.2004.1283654,
author = {Daniela De Venuto},
title = {New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2004},
issn = {2003116307},
pages = {81-85},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283654},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation
SN - 2003116307
SP81
EP85
A1 - Daniela De Venuto,
PY - 2004
KW - null
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Daniela De Venuto, Politecnico di Bari
A new solution to improve the testability of high resolution ΣΔ Analogue to Digital Converters (ΣΔ ADC's) using the quantizer input as test node is described. Both, the theory of the method and results from high level simulations for a 16 bit audio ADC example are presented. The analysis demonstrates the potential to reduce the computation overhead associated with test response analysis versus conventional techniques.
Citation:
Daniela De Venuto, "New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation," isqed, pp.81-85, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004
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