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Static Specification Analysis for Termination of Specification-Based Data Structure Repair
Denver, Colorado November 17-November 21
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.125103214th International Symposium on Softw ...
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Brian Demsky, Martin Rinard, "Static Specification Analysis for Termination of Specification-Based Data Structure Repair," Software Reliability Engineering, International Symposium on, pp. 71, 14th International Symposium on Software Reliability Engineering, 2003.
 
 
BibTex
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@article{ 10.1109/ISSRE.2003.1251032,
author = {Brian Demsky and Martin Rinard},
title = {Static Specification Analysis for Termination of Specification-Based Data Structure Repair},
journal ={Software Reliability Engineering, International Symposium on},
volume = {0},
year = {2003},
issn = {1071-9458},
pages = {71},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.1251032},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Software Reliability Engineering, International Symposium on
TI - Static Specification Analysis for Termination of Specification-Based Data Structure Repair
SN - 1071-9458
SP
EP
A1 - Brian Demsky,
A1 - Martin Rinard,
PY - 2003
KW - null
VL - 0
JA - Software Reliability Engineering, International Symposium on
ER -
 
Brian Demsky, Massachusetts Institute of Technology
Martin Rinard, Massachusetts Institute of Technology
We have developed a system that accepts a specification of key data structure consistency constraints, then dynamically detects and repairs violations of these constraints. It is possible to write specifications that are not satisfiable or that for other reasons may cause the repair process to not terminate. We present a static specification analysis that determines whether the repair process will terminate for a given specification.
Citation:
Brian Demsky, Martin Rinard, "Static Specification Analysis for Termination of Specification-Based Data Structure Repair," issre, pp.71, 14th International Symposium on Software Reliability Engineering, 2003
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