Packet-Based Input Test Data Compression Techniques

Baltimore, MD, USA October 07-October 10

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041756

International Test Conference 2002 (I ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Erik H. Volkerink Articles by Ajay Khoche Articles by Subhasish Mitra

	ASCII Text	x
	Erik H. Volkerink, Ajay Khoche, Subhasish Mitra, "Packet-Based Input Test Data Compression Techniques," Test Conference, International, pp. 154, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041756, author = {Erik H. Volkerink and Ajay Khoche and Subhasish Mitra}, title = {Packet-Based Input Test Data Compression Techniques}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {154}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041756}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Packet-Based Input Test Data Compression Techniques SN - 0-7803-7543-2 SP EP A1 - Erik H. Volkerink, A1 - Ajay Khoche, A1 - Subhasish Mitra, PY - 2002 KW - Compression KW - RLE KW - Huffman KW - Golomb-Rice KW - LFSR KW - BIST KW - ATE KW - EDA VL - 0 JA - Test Conference, International ER -

Erik H. Volkerink, Stanford University and Agilent Laboratories

Ajay Khoche, Agilent Laboratories

Subhasish Mitra, Intel Corporation

This paper presents a test input data compression technique, which can be use to reduce input test data volume, test time, and the number of required tester channels. The technique is based on grouping data packets and applying various binary encoding techniques, such as Huffman codes and Golomb-Rice codes. Experiments on actual industrial designs and benchmark circuits show an input vector data reduction ranging from 17x to 70x.

Index Terms:

Compression, RLE, Huffman, Golomb-Rice, LFSR, BIST, ATE, EDA

Citation:

Erik H. Volkerink, Ajay Khoche, Subhasish Mitra, "Packet-Based Input Test Data Compression Techniques," itc, pp.154, International Test Conference 2002 (ITC'02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.