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A Persistent Diagnostic Technique for Unstable Defects
Baltimore, MD, USA October 07-October 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041766International Test Conference 2002 (I ...
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Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, "A Persistent Diagnostic Technique for Unstable Defects," Test Conference, International, pp. 242, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
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@article{ 10.1109/TEST.2002.1041766,
author = {Yasuo Sato and Iwao Yamazaki and Hiroki Yamanaka and Toshio Ikeda and Masahiro Takakura},
title = {A Persistent Diagnostic Technique for Unstable Defects},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {242},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041766},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - A Persistent Diagnostic Technique for Unstable Defects
SN - 0-7803-7543-2
SP
EP
A1 - Yasuo Sato,
A1 - Iwao Yamazaki,
A1 - Hiroki Yamanaka,
A1 - Toshio Ikeda,
A1 - Masahiro Takakura,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Yasuo Sato, Hitachi, Ltd.
Iwao Yamazaki, Hitachi, Ltd.
Hiroki Yamanaka, Hitachi, Ltd.
Toshio Ikeda, Hitachi, Ltd.
Masahiro Takakura, Hitachi Engineering Co., Ltd.
We present a persistent diagnostic technique for unstable defects, such as open defects or delay defects. A new "segment model" diagnosis for the completely open defects will be discussed. Here, we not only focus on the behavior of the principal offender, but also the behavior of the accomplices which cause the unstable behavior of the defect. In this paper, a technique using the layout information for an open faul diagnosis, and a testing method for the delay fault will be discussed. Some experimental results of actual chips will be shown.
Citation:
Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, "A Persistent Diagnostic Technique for Unstable Defects," itc, pp.242, International Test Conference 2002 (ITC'02), 2002
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