BIST-Based Diagnosis of FPGA Interconnect

Baltimore, MD, USA October 07-October 10

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041813

International Test Conference 2002 (I ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Charles Stroud Articles by Jeremy Nall Articles by Matthew Lashinsky Articles by Miron Abramovici

	ASCII Text	x
	Charles Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici, "BIST-Based Diagnosis of FPGA Interconnect," Test Conference, International, pp. 618, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041813, author = {Charles Stroud and Jeremy Nall and Matthew Lashinsky and Miron Abramovici}, title = {BIST-Based Diagnosis of FPGA Interconnect}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {618}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041813}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - BIST-Based Diagnosis of FPGA Interconnect SN - 0-7803-7543-2 SP EP A1 - Charles Stroud, A1 - Jeremy Nall, A1 - Matthew Lashinsky, A1 - Miron Abramovici, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Charles Stroud, University of North Carolina at Charlotte

Jeremy Nall, University of North Carolina at Charlotte

Matthew Lashinsky, University of North Carolina at Charlotte

Miron Abramovici, Agere Systems

We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the technique has been proven to be an excellent approach for off-line testing and diagnosis as well, providing high-resolution diagnostics with the ability to identify the faulty wire segment or programmable switch. We have implemented this BIST-based diagnostic approach on the ORCA series FPGA and present the results of testing and diagnosing known defective FPGAs.¹

Citation:

Charles Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici, "BIST-Based Diagnosis of FPGA Interconnect," itc, pp.618, International Test Conference 2002 (ITC'02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.