loading...
EEPROM Memory: Threshold Voltage Built In Self Diagnosis
Charlotte, NC, USA September 30-October 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270821International Test Conference 2003 (I ...
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
J. M. Portal, H. Aziza, D. N?, "EEPROM Memory: Threshold Voltage Built In Self Diagnosis," Test Conference, International, pp. 23, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/TEST.2003.1270821,
author = {J. M. Portal and H. Aziza and D. N?},
title = {EEPROM Memory: Threshold Voltage Built In Self Diagnosis},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {23},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270821},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - EEPROM Memory: Threshold Voltage Built In Self Diagnosis
SN - 1089-3539
SP
EP
A1 - J. M. Portal,
A1 - H. Aziza,
A1 - D. N?,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
J. M. Portal, IMT - Technop?le de Ch?teau Gombert
H. Aziza, IMT - Technop?le de Ch?teau Gombert; ST-Microelectronics
D. N?, ST-Microelectronics
Knowing, that the threshold voltage of the EEPROM memory cells is a key parameter to determine the overall performance of the memory, a build in structure to extract this information is a very relevant choice to fast diagnose failure in the memory. Thus, the objective of this paper is to present a built in self-diagnosis of EEPROM memory cells, based on threshold voltage extraction. In order to extract the threshold voltage, the modified circuit and the associated test sequence are presented. Based on the threshold voltage extraction, complementary information is proposed to improve the classical memory diagnosis methodology.
Citation:
J. M. Portal, H. Aziza, D. N?, "EEPROM Memory: Threshold Voltage Built In Self Diagnosis," itc, pp.23, International Test Conference 2003 (ITC'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.