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First IC Validation of IEEE Std. 1149.6
Charlotte, NC, USA September 30-October 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270890International Test Conference 2003 (I ...
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Suzette Vandivier, Mark Wahl, Jeff Rearick, "First IC Validation of IEEE Std. 1149.6," Test Conference, International, pp. 632, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270890,
author = {Suzette Vandivier and Mark Wahl and Jeff Rearick},
title = {First IC Validation of IEEE Std. 1149.6},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {632},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270890},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - First IC Validation of IEEE Std. 1149.6
SN - 1089-3539
SP
EP
A1 - Suzette Vandivier,
A1 - Mark Wahl,
A1 - Jeff Rearick,
PY - 2003
KW - 1149.6
KW - test receiver
VL - 0
JA - Test Conference, International
ER -
 
Suzette Vandivier, Agilent Technologies, Ft. Collins, CO.
Mark Wahl, Agilent Technologies, Ft. Collins, CO.
Jeff Rearick, Agilent Technologies, Ft. Collins, CO.
This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests were applied to functional channels as well as channels with a set of externally-induced hard defects. All valid signals were correctly received, and all defects were detected, thus validating both 1149.6's anticipated backwards compatibility with 1149.1 and fault coverage. Mission-mode tests showed no performance degradation due to the test circuits. Characterization across PVT of the test receiver suggests 1149.6's robustness with respect to noise.
Index Terms:
1149.6, test receiver
Citation:
Suzette Vandivier, Mark Wahl, Jeff Rearick, "First IC Validation of IEEE Std. 1149.6," itc, pp.632, International Test Conference 2003 (ITC'03), 2003
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