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Impedance Profile of a Commercial Power Grid and Test System
Charlotte, NC, USA September 30-October 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270900International Test Conference 2003 (I ...
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Dhruva Acharyya, Jim Plusquellic, "Impedance Profile of a Commercial Power Grid and Test System," Test Conference, International, pp. 709, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270900,
author = {Dhruva Acharyya and Jim Plusquellic},
title = {Impedance Profile of a Commercial Power Grid and Test System},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {709},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270900},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Impedance Profile of a Commercial Power Grid and Test System
SN - 1089-3539
SP
EP
A1 - Dhruva Acharyya,
A1 - Jim Plusquellic,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Dhruva Acharyya, University of Maryland, Baltimore County
Jim Plusquellic, University of Maryland, Baltimore County
An impedance profile of a commercial power grid and a tester power distribution system is developed in this paper. The profile is used to identify the measurable frequency range of the power supply transient signals generated by a chip. Several resistance-capacitance (RC) models of the power grid are analyzed to determine the impact of each capacitance type. The impedance profile of a C4-based production testing environment is then developed. The impedance profile of the combined probe card and the power grid RC models illustrates the range of frequencies that are measurable at the supply ports of the chip-under-test (CUT). The results suggest that it is possible to measure the important frequency components of a chip's power supply transients in a production test environment for use in fault detection and localization procedures.
Citation:
Dhruva Acharyya, Jim Plusquellic, "Impedance Profile of a Commercial Power Grid and Test System," itc, pp.709, International Test Conference 2003 (ITC'03), 2003
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