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DFFT : Design For Functional Testability
Charlotte, NC, USA September 30-October 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271099International Test Conference 2003 (I ...
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Haluk Konuk, Leon Xiao, "DFFT : Design For Functional Testability," Test Conference, International, pp. 1105, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1271099,
author = {Haluk Konuk and Leon Xiao},
title = {DFFT : Design For Functional Testability},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {1105},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271099},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - DFFT : Design For Functional Testability
SN - 1089-3539
SP
EP
A1 - Haluk Konuk,
A1 - Leon Xiao,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Haluk Konuk, Broadcom Corporation, Santa Clara, California
Leon Xiao, Broadcom Corporation, Santa Clara, California
Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC on an ATE. Taking these mechanisms into account during the design process of a chip can substantially reduce the efforts needed to make functional tests work. We call this process design for functional testability (DFFT).
Citation:
Haluk Konuk, Leon Xiao, "DFFT : Design For Functional Testability," itc, pp.1105, International Test Conference 2003 (ITC'03), 2003
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