Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions

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http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271110

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	Similar Articles Articles by Frank Poehl Articles by Matthias Beck Articles by Ralf Arnold Articles by Peter Muhmenthaler Articles by Nagesh Tamarapalli Articles by Mark Kassab Articles by Nilanjan Mukherjee Articles by Janusz Rajski

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	Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, "Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions," Test Conference, International, pp. 1211, International Test Conference 2003 (ITC'03), 2003.

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	@article{ 10.1109/TEST.2003.1271110, author = {Frank Poehl and Matthias Beck and Ralf Arnold and Peter Muhmenthaler and Nagesh Tamarapalli and Mark Kassab and Nilanjan Mukherjee and Janusz Rajski}, title = {Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1211}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271110}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

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	TY - CONF JO - Test Conference, International TI - Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions SN - 1089-3539 SP EP A1 - Frank Poehl, A1 - Matthias Beck, A1 - Ralf Arnold, A1 - Peter Muhmenthaler, A1 - Nagesh Tamarapalli, A1 - Mark Kassab, A1 - Nilanjan Mukherjee, A1 - Janusz Rajski, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Frank Poehl, Infineon Technologies AG, Munich, Germany

Matthias Beck, Infineon Technologies AG, Munich, Germany

Ralf Arnold, Infineon Technologies AG, Munich, Germany

Peter Muhmenthaler, Mentor Graphics Corporation, Wilsonville, OR

Nagesh Tamarapalli, Mentor Graphics Corporation, Wilsonville, OR

Mark Kassab, Mentor Graphics Corporation, Wilsonville, OR

Nilanjan Mukherjee, Mentor Graphics Corporation, Wilsonville, OR

Janusz Rajski, Mentor Graphics Corporation, Wilsonville, OR

This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quality. The System-on-Chip (SoC) design flow and the changes necessary to successfully implement EDT are presented. Experimental results for three SoC designs targeted for automotive, wireless, and data communication applications are provided. These results demonstrate that EDT, with no performance impact, little area overhead, and minimal impact to the flow, results in a significant reduction of scan test data volume and scan test time while maintaining the test quality levels.

Citation:

Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, "Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions," itc, pp.1211, International Test Conference 2003 (ITC'03), 2003

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