Graham Hetherington, Richard Simpson,
"Circular BIST testing the digital logic within a high speed Serdes,"
Test Conference, International, pp. 1221, International Test Conference 2003 (ITC'03), 2003.
BibTex
x
@article{
10.1109/TEST.2003.1271111, author = {Graham Hetherington and Richard Simpson}, title = {Circular BIST testing the digital logic within a high speed Serdes}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1221}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271111}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Test Conference, International TI - Circular BIST testing the digital logic within a high speed Serdes SN - 1089-3539 SP EP A1 - Graham Hetherington, A1 - Richard Simpson, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using circular BIST.
Citation:
Graham Hetherington, Richard Simpson, "Circular BIST testing the digital logic within a high speed Serdes," itc, pp.1221, International Test Conference 2003 (ITC'03), 2003
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