Ch. Anderson, A. von Mayrhauser, T. Chen,
"Assessing Neural Networks as Guides for Testing Activities,"
Software Metrics, IEEE International Symposium on, pp. 155, Third International Software Metrics Symposium (METRICS'96), 1996.
BibTex
x
@article{
10.1109/METRIC.1996.492452, author = {Ch. Anderson and A. von Mayrhauser and T. Chen}, title = {Assessing Neural Networks as Guides for Testing Activities}, journal ={Software Metrics, IEEE International Symposium on}, volume = {0}, year = {1996}, isbn = {0-8186-7364-8}, pages = {155}, doi = {http://doi.ieeecomputersociety.org/10.1109/METRIC.1996.492452}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Software Metrics, IEEE International Symposium on TI - Assessing Neural Networks as Guides for Testing Activities SN - 0-8186-7364-8 SP EP A1 - Ch. Anderson, A1 - A. von Mayrhauser, A1 - T. Chen, PY - 1996 KW - neural networks KW - test case effectiveness KW - test guidance VL - 0 JA - Software Metrics, IEEE International Symposium on ER -
neural networks, test case effectiveness, test guidance
Citation:
Ch. Anderson, A. von Mayrhauser, T. Chen, "Assessing Neural Networks as Guides for Testing Activities," metrics, pp.155, Third International Software Metrics Symposium (METRICS'96), 1996
PURCHASE ARTICLE: $19
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb