A DOT1 & DOT4 MOSIS - Compatible Library

Anaheim, California June 01-June 02

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http://doi.ieeecomputersociety.org/10.1109/MSE.2003.1205265

2003 International Conference on Micr ...

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	ASCII Text	x
	Andrzej Rucinski, Barrett Stetson, S.T.P. Brundavani, "A DOT1 & DOT4 MOSIS - Compatible Library," Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on, pp. 83, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003.

	BibTex	x
	@article{ 10.1109/MSE.2003.1205265, author = {Andrzej Rucinski and Barrett Stetson and S.T.P. Brundavani}, title = {A DOT1 & DOT4 MOSIS - Compatible Library}, journal ={Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on}, volume = {0}, year = {2003}, isbn = {0-7695-1973-3}, pages = {83}, doi = {http://doi.ieeecomputersociety.org/10.1109/MSE.2003.1205265}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on TI - A DOT1 & DOT4 MOSIS - Compatible Library SN - 0-7695-1973-3 SP EP A1 - Andrzej Rucinski, A1 - Barrett Stetson, A1 - S.T.P. Brundavani, PY - 2003 KW - null VL - 0 JA - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on ER -

Andrzej Rucinski, University of New Hampshire

Barrett Stetson, University of New Hampshire

S.T.P. Brundavani, University of New Hampshire

There exists a lack of balance between design and testing topics in microelectronic curricula. However, boundary scan as a virtual probe presents an opportunity to teach testing and design for testability in such a curriculum. This effort is facilitated by the use of IEEE standards, universal acceptance in industry, and the availability of low cost test equipment. This paper introduces a library of boundary scan components based on the IEEE standards. The library is being verified using the AMI 0.5 micron 40 pin Tiny Chip VLSI device fabricated through MOSIS services.

Citation:

Andrzej Rucinski, Barrett Stetson, S.T.P. Brundavani, "A DOT1 & DOT4 MOSIS - Compatible Library," mse, pp.83, 2003 International Conference on Microelectronics Systems Education (MSE'03), 2003

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