loading...
A Method to Caculate Redundancy Coverage for FLASH Memory
San Jose, California August 06-August 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTDT.2001.945226International Workshop on Memory Tech ...
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
S. Matarrese, L. Fasoli, "A Method to Caculate Redundancy Coverage for FLASH Memory," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 0041, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001.
 
 
BibTex
x
 
@article{ 10.1109/MTDT.2001.945226,
author = {S. Matarrese and L. Fasoli},
title = {A Method to Caculate Redundancy Coverage for FLASH Memory},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2001},
isbn = {0-7695-1242-9},
pages = {0041},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2001.945226},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - A Method to Caculate Redundancy Coverage for FLASH Memory
SN - 0-7695-1242-9
SP
EP
A1 - S. Matarrese,
A1 - L. Fasoli,
PY - 2001
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
S. Matarrese, STMicroelectronics
L. Fasoli, STMicroelectronics
Abstract: This paper presents a method to calculate the redundancy coverage for FLASH memory. The method can be used to compare different redundancy architectures and gives the probability to be able to repair a certain number of random fails. After a brief introduction, the hypothesis and the method will be presented. Few illustrative examples are provided.
Citation:
S. Matarrese, L. Fasoli, "A Method to Caculate Redundancy Coverage for FLASH Memory," mtdt, pp.0041, International Workshop on Memory Technology, Design, and Testing (MTDT'01), 2001
Usage of this product signifies your acceptance of the Terms of Use.